IBM made thermometer for quick search of overheating in the chips with the norms of less than 14 nm

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POSTER: computer news   ||   IBM MADE THERMOMETER FOR QUICK SEARCH OF OVERHEATING IN THE CHIPS WITH THE NORMS OF LESS THAN 14 NM	DATE:2016-12-06
At the conference, IEDM 2016 (IEEE International Electron Devices Meeting 2016) Representatives from IBM's labs in Zurich have made a report, which talked about the "thermometer" for the removal of temperature readings from the surface of chips issued to the norms of less than 14 nm.  The proposed method by creating a heat map of the chip has a high accuracy.  It was used to evaluate the design of the company's 10-nanometer chips, including the measurement of the degree of heating of individual transistors or memory cells.  Temperature map of the chip surface removed within two minutes.  This is a great tool for designers that helps  quickly find areas with high heat and eliminate defects. The staff used atomic force microscopy as a basis for the instrument.  In addition to the probe microscope mounted heat emitter (injector) and a scanning temperature sensor.  The heat flux heats the areas of non-working chip, on which slides the probe and temperature sensor measures the heat flow from the heated areas. The second step is scanning the working chip, which, together with the data obtained in advance of the thermal resistance in the crystal allows to build a heat map of the working elements of the chip.  Developers say the present invention is so useful in the design of chips that are prepared to license the technology to all interested companies. Related Products :

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